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author | Akinobu Mita <akinobu.mita@gmail.com> | 2017-11-24 09:40:45 -0500 |
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committer | Mauro Carvalho Chehab <mchehab@s-opensource.com> | 2017-12-08 09:23:12 -0500 |
commit | b48d908d2b04e5c11bf0f9035bf52f7c0c988603 (patch) | |
tree | 08408a95f73dece6f311a3b31b25b19f42554ae6 /drivers/thermal | |
parent | 344aa836e813a6b097c23f2e0633dd17f62c2ed7 (diff) |
media: ov7670: add V4L2_CID_TEST_PATTERN control
The ov7670 has the test pattern generator features. This makes use of
it through V4L2_CID_TEST_PATTERN control.
Cc: Jonathan Corbet <corbet@lwn.net>
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab@s-opensource.com>
Diffstat (limited to 'drivers/thermal')
0 files changed, 0 insertions, 0 deletions