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authorAkinobu Mita <akinobu.mita@gmail.com>2017-11-24 09:40:45 -0500
committerMauro Carvalho Chehab <mchehab@s-opensource.com>2017-12-08 09:23:12 -0500
commitb48d908d2b04e5c11bf0f9035bf52f7c0c988603 (patch)
tree08408a95f73dece6f311a3b31b25b19f42554ae6 /drivers/thermal
parent344aa836e813a6b097c23f2e0633dd17f62c2ed7 (diff)
media: ov7670: add V4L2_CID_TEST_PATTERN control
The ov7670 has the test pattern generator features. This makes use of it through V4L2_CID_TEST_PATTERN control. Cc: Jonathan Corbet <corbet@lwn.net> Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com> Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com> Signed-off-by: Mauro Carvalho Chehab <mchehab@s-opensource.com>
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