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authorBoris Brezillon <bbrezillon@kernel.org>2018-11-04 14:50:28 +0100
committerMiquel Raynal <miquel.raynal@bootlin.com>2019-04-08 10:21:14 +0200
commit7beb37e5f0d29d7d23aec0e47900ff4dfa8c2e55 (patch)
tree952eaed59e5a42382a905bd1f0c7d65d69a121c7 /drivers/mtd/nand
parentd974541e23791e189c5faa0462223d29352cecc6 (diff)
mtd: rawnand: Use nanddev_mtd_max_bad_blocks()
nanddev_mtd_max_bad_blocks() is implemented by the generic NAND layer and is already doing what we need. Reuse this function instead of having our own implementation. While at it, get rid of the ->max_bb_per_die and ->blocks_per_die fields which are now unused. Signed-off-by: Boris Brezillon <bbrezillon@kernel.org> Signed-off-by: Miquel Raynal <miquel.raynal@bootlin.com> Reviewed-by: Frieder Schrempf <frieder.schrempf@kontron.de>
Diffstat (limited to 'drivers/mtd/nand')
-rw-r--r--drivers/mtd/nand/raw/nand_base.c38
-rw-r--r--drivers/mtd/nand/raw/nand_onfi.c3
2 files changed, 1 insertions, 40 deletions
diff --git a/drivers/mtd/nand/raw/nand_base.c b/drivers/mtd/nand/raw/nand_base.c
index 26aeea06035b..035b9cf327a6 100644
--- a/drivers/mtd/nand/raw/nand_base.c
+++ b/drivers/mtd/nand/raw/nand_base.c
@@ -4298,42 +4298,6 @@ static int nand_block_markbad(struct mtd_info *mtd, loff_t ofs)
}
/**
- * nand_max_bad_blocks - [MTD Interface] Max number of bad blocks for an mtd
- * @mtd: MTD device structure
- * @ofs: offset relative to mtd start
- * @len: length of mtd
- */
-static int nand_max_bad_blocks(struct mtd_info *mtd, loff_t ofs, size_t len)
-{
- struct nand_chip *chip = mtd_to_nand(mtd);
- u32 part_start_block;
- u32 part_end_block;
- u32 part_start_die;
- u32 part_end_die;
-
- /*
- * max_bb_per_die and blocks_per_die used to determine
- * the maximum bad block count.
- */
- if (!chip->max_bb_per_die || !chip->blocks_per_die)
- return -ENOTSUPP;
-
- /* Get the start and end of the partition in erase blocks. */
- part_start_block = mtd_div_by_eb(ofs, mtd);
- part_end_block = mtd_div_by_eb(len, mtd) + part_start_block - 1;
-
- /* Get the start and end LUNs of the partition. */
- part_start_die = part_start_block / chip->blocks_per_die;
- part_end_die = part_end_block / chip->blocks_per_die;
-
- /*
- * Look up the bad blocks per unit and multiply by the number of units
- * that the partition spans.
- */
- return chip->max_bb_per_die * (part_end_die - part_start_die + 1);
-}
-
-/**
* nand_suspend - [MTD Interface] Suspend the NAND flash
* @mtd: MTD device structure
*/
@@ -5819,7 +5783,7 @@ static int nand_scan_tail(struct nand_chip *chip)
mtd->_block_isreserved = nand_block_isreserved;
mtd->_block_isbad = nand_block_isbad;
mtd->_block_markbad = nand_block_markbad;
- mtd->_max_bad_blocks = nand_max_bad_blocks;
+ mtd->_max_bad_blocks = nanddev_mtd_max_bad_blocks;
/*
* Initialize bitflip_threshold to its default prior scan_bbt() call.
diff --git a/drivers/mtd/nand/raw/nand_onfi.c b/drivers/mtd/nand/raw/nand_onfi.c
index f3f59cf37d7f..3ca9c8923a30 100644
--- a/drivers/mtd/nand/raw/nand_onfi.c
+++ b/drivers/mtd/nand/raw/nand_onfi.c
@@ -251,9 +251,6 @@ int nand_onfi_detect(struct nand_chip *chip)
memorg->bits_per_cell = p->bits_per_cell;
chip->bits_per_cell = p->bits_per_cell;
- chip->max_bb_per_die = le16_to_cpu(p->bb_per_lun);
- chip->blocks_per_die = le32_to_cpu(p->blocks_per_lun);
-
if (le16_to_cpu(p->features) & ONFI_FEATURE_16_BIT_BUS)
chip->options |= NAND_BUSWIDTH_16;