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| author | Martin Fuzzey <mfuzzey@parkeon.com> | 2015-02-19 15:16:04 +0100 |
|---|---|---|
| committer | Jonathan Cameron <jic23@kernel.org> | 2015-03-09 13:30:28 +0000 |
| commit | d1bd4867b0959d5221dc528ccf60c8534aae865d (patch) | |
| tree | 3d5d4755d88ed9c47ca0e7319fc2929565f2e2ef /Documentation/ABI/testing/sysfs-bus-iio | |
| parent | debf6d843eaa3622786c45eb6edbc46f38f31a90 (diff) | |
iio: doc: Describe scale attributes for event thresholds
Signed-off-by: Martin Fuzzey <mfuzzey@parkeon.com>
Signed-off-by: Jonathan Cameron <jic23@kernel.org>
Diffstat (limited to 'Documentation/ABI/testing/sysfs-bus-iio')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 18 |
1 files changed, 18 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 9a70c31619ea..923070934228 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -661,6 +661,24 @@ Description: value is in raw device units or in processed units (as _raw and _input do on sysfs direct channel read attributes). +What: /sys/.../events/in_accel_scale +What: /sys/.../events/in_accel_peak_scale +What: /sys/.../events/in_anglvel_scale +What: /sys/.../events/in_magn_scale +What: /sys/.../events/in_rot_from_north_magnetic_scale +What: /sys/.../events/in_rot_from_north_true_scale +What: /sys/.../events/in_voltage_scale +What: /sys/.../events/in_voltage_supply_scale +What: /sys/.../events/in_temp_scale +What: /sys/.../events/in_illuminance_scale +What: /sys/.../events/in_proximity_scale +KernelVersion: 3.21 +Contact: linux-iio@vger.kernel.org +Description: + Specifies the conversion factor from the standard units + to device specific units used to set the event trigger + threshold. + What: /sys/.../events/in_accel_x_thresh_rising_hysteresis What: /sys/.../events/in_accel_x_thresh_falling_hysteresis What: /sys/.../events/in_accel_x_thresh_either_hysteresis |