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This patch just replace the string 'selftest' with 'unittest'
in OF unittest and data and binding file.
I have tested it successfully on ARM.
Signed-off-by: Wang Long <long.wanglong@huawei.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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If CONFIG_OF_UNITTEST=y then a kernel image make will always cause .version to
be incremented, even if there are not source changes. This is caused by
a lack of dependency tracking and checking for
drivers/of/unittest-data/testcases.dtb.o.
Signed-off-by: Frank Rowand <frank.rowand@sonymobile.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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Introduce I2C device tree overlay tests.
Tests insertion and removal of i2c adapters, i2c devices, and muxes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Rob Herring <robh@kernel.org>
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Introduce selftests for overlays using sub-devices present
in children nodes.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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Add unittests for OF overlays.
It tests overlay device addition/removal and whether
the apply revert sequence is correct.
Changes since V1:
* Added local fixups entries.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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The original resolver format is way too cryptic, switch
to using a tree based format that gets rid of repetitions,
is more compact and readable.
At the same time, update the selftests to using the new local fixups
format.
Signed-off-by: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
[grant.likely: Squashed in testcase changes and merged similar functions]
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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This is unit testing code. It should use that name because it makes more
sense than 'selftest'. Rename the files to match and rename the config
variable.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
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