| Age | Commit message (Collapse) | Author |
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This adds the double bit error detection test cases listed below:
* Prepare data block with double bit error and ECC data without
corruption, and verify that the uncorrectable error is detected by
__nand_correct_data().
* Prepare data block with single bit error and ECC data with single bit
error, and verify that the uncorrectable error is detected.
* Prepare data block without corruption and ECC data with double bit
error, and verify that the uncorrectable error is detected.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This adds the single bit error correction test case listed below:
Prepare data block without corruption and ECC data with single bit error,
and verify that the data block is preserved by __nand_correct_data().
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This adds no corruptin test case listed below:
Prepare data block and ECC data with no corruption, and verify that
the data block is preserved by __nand_correct_data()
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This rewrites the entire test routine in order to make it easy to add more
tests by later changes and minimize duplication of each tests as much as
possible.
Now that each test is described by the members of struct nand_ecc_test:
- name: descriptive testname
- prepare: function to prepare data block and ecc with artifical corruption
- verify: function to verify the result of correcting data block
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Currently inject_single_bit_error() is used to inject single bit error
into randomly selected bit position of the 256 or 512 bytes data block.
Later change will add tests which inject bit errors into the ecc code.
Unfortunately, inject_single_bit_error() doesn't work for the ecc code
which is not a multiple of sizeof(unsigned long).
Because bit fliping at random position is done by __change_bit().
For example, flipping bit position 0 by __change_bit(0, addr) modifies
3rd byte (32bit) or 7th byte (64bit) on big-endian systems.
Using little-endian version of bitops can fix this issue. But
little-endian version of __change_bit is not yet available.
So this defines __change_bit_le() locally in a similar fashion to
asm-generic/bitops/le.h and use it.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This tests ECC biterror recovery on a single NAND page. Mostly intended
to test ECC hardware and low-level NAND driver.
There are two test modes:
0 - artificially inserting bit errors until the ECC fails
This is the default method and fairly quick. It should
be independent of the quality of the FLASH.
1 - re-writing the same pattern repeatedly until the ECC fails.
This method relies on the physics of NAND FLASH to eventually
generate '0' bits if '1' has been written sufficient times. Depending
on the NAND, the first bit errors will appear after 1000 or
more writes and then will usually snowball, reaching the limits
of the ECC quickly.
The test stops after 10000 cycles, should your FLASH be exceptionally
good and not generate bit errors before that. Try a different page
offset in that case.
Please note that neither of these tests will significantly 'use up' any FLASH
endurance. Only a maximum of two erase operations will be performed.
Signed-off-by: Iwo Mergler <Iwo.Mergler@netcommwireless.com.au>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Currently the data blocks which is used to test single bit error
correction is allocated statically and injecting single bit error is
implemented by using __change_bit() which must operate on the memory
aligned to the size of an "unsigned long". But there is no such
guarantee for statically allocated array.
This fix the issue by allocating the data block dynamically by
kmalloc(). It also allocate the ecc code dynamically instead of
allocating statically on stack.
The reason to allocate the ecc code dynamically is that later change
will add tests which inject bit errors into the ecc code by bitops.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This includes the message related changes:
- Use pr_* instead of printk
- Print hexdump of ECC code if test fails
- Change log level for hexdump of data from KERN_DEBUG to KERN_INFO
- Factor out the hexdump code into a separate function
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Return -EINVAL instead of -1 (-EPERM) when test fails.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Including linux/jiffies.h was required for calling srandom32(jiffies)
that has already been removed.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Return an error code if test fails in order to detect a test case failure
by invoking tests repeatedly like this:
while sudo modprobe mtd_nandecctest; do
sudo modprobe -r mtd_nandecctest
done
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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It is unnecessary for this driver to call srandom32() in module_init.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This is a clean-up patch which removes the own pseudo-random numbers generator
from the speed- and stress-tests and makes them use the 'random32()' generator
instead.
[dwmw2: Merge later fix for negative offsets]
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This patch introduces new 'mtd_can_have_bb()' helper function which checks
whether the flash can have bad eraseblocks. Then it changes all the
direct 'mtd->block_isbad' use cases with 'mtd_can_have_bb()'.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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MTD functions always assign the 'retlen' argument to 0 at the very
beginning - the callers do not have to do this.
I used the following semantic patch to find these places:
@@
identifier retlen;
expression a, b, c, d, e;
constant C;
type T;
@@
(
- retlen = C;
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T
-retlen = C
+ retlen
;
)
... when != retlen
when exists
(
mtd_read(a, b, c, &retlen, d)
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mtd_write(a, b, c, &retlen, d)
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mtd_panic_write(a, b, c, &retlen, d)
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mtd_point(a, b, c, &retlen, d, e)
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mtd_read_fact_prot_reg(a, b, c, &retlen, d)
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mtd_write_user_prot_reg(a, b, c, &retlen, d)
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mtd_read_user_prot_reg(a, b, c, &retlen, d)
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mtd_writev(a, b, c, d, &retlen)
)
I ran it twice, because there were cases of double zero assigments
in mtd tests. Then I went through the patch to verify that spatch
did not find any false positives.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This patch is part of a patch-set which changes the MTD interface
from 'mtd->func()' form to 'mtd_func()' form. We need this because
we want to add common code to to all drivers in the mtd core level,
which is impossible with the current interface when MTD clients
call driver functions like 'read()' or 'write()' directly.
At this point we just introduce a new inline wrapper function, but
later some of them are expected to gain more code. E.g., the input
parameters check should be moved to the wrappers rather than be
duplicated at many drivers.
This particular patch introduced the 'mtd_erase()' interface. The
following patches add all the other interfaces one by one.
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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stresstest needs at least two eraseblocks. Bail out gracefully if that
condition is not met. Fixes the following 'division by zero' OOPS:
[ 619.100000] mtd_stresstest: MTD device size 131072, eraseblock size 131072, page size 2048, count of eraseblocks 1, pages per eraseblock 64, OOB size 64
[ 619.120000] mtd_stresstest: scanning for bad eraseblocks
[ 619.120000] mtd_stresstest: scanned 1 eraseblocks, 0 are bad
[ 619.130000] mtd_stresstest: doing operations
[ 619.130000] mtd_stresstest: 0 operations done
[ 619.140000] Division by zero in kernel.
...
caused by
/* Read or write up 2 eraseblocks at a time - hence 'ebcnt - 1' */
eb %= (ebcnt - 1);
Cc: stable@kernel.org
Signed-off-by: Wolfram Sang <w.sang@pengutronix.de>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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mtd tests may erase the mtd device, so force the user to specify which
mtd device to test by using the module parameter. Disable the default
(using mtd0) since this may destroy a vital part of the flash if the
module is inserted accidently or carelessly.
Reported-by: Roland Kletzing <devzero@web.de>
Signed-off-by: Wolfram Sang <w.sang@pengutronix.de>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@intel.com>
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Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@intel.com>
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These modes are not necessarily for OOB only. Particularly, MTD_OOB_RAW
affected operations on in-band page data as well. To clarify these
options and to emphasize that their effect is applied per-operation, we
change the primary prefix to MTD_OPS_.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@intel.com>
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read_oob may now return ECC error codes. If the code is -EUCLEAN, then
we can safely ignore the error as a corrected bitflip.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <dedekind1@gmail.com>
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32-bit integers used in 'calc_speed()' may overflow and lead to
incorrect results. Use 64-bit integers instead.
Signed-off-by: David Lambert <dave@lambsys.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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New multiblock erase speed test is added to mtd_speedtest.
It consists of 2-, 4-, 8-, 16-, 32- and 64-blocks at once
multiblock erase tests.
Signed-off-by: Roman Tereshonkov <roman.tereshonkov@nokia.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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By default mtd_speedtest uses all the eraseblocks of the
MTD partition being tested. For large partitions a
smaller number is sufficient and makes running the test
quicker. For that reason, add a parameter 'count' to
specify the maximum number of eraseblocks to use for
testing.
Signed-off-by: Adrian Hunter <adrian.hunter@nokia.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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The ebcnt and pgcnt variable initialization is moved before printk
which uses them.
Signed-off-by: Roman Tereshonkov <roman.tereshonkov@nokia.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Use kzalloc rather than the combination of kmalloc and memset.
The semantic patch that makes this change is as follows:
(http://coccinelle.lip6.fr/)
// <smpl>
@@
expression x,size,flags;
statement S;
@@
-x = kmalloc(size,flags);
+x = kzalloc(size,flags);
if (x == NULL) S
-memset(x, 0, size);
// </smpl>
Signed-off-by: Julia Lawall <julia@diku.dk>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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implicit slab.h inclusion from percpu.h
percpu.h is included by sched.h and module.h and thus ends up being
included when building most .c files. percpu.h includes slab.h which
in turn includes gfp.h making everything defined by the two files
universally available and complicating inclusion dependencies.
percpu.h -> slab.h dependency is about to be removed. Prepare for
this change by updating users of gfp and slab facilities include those
headers directly instead of assuming availability. As this conversion
needs to touch large number of source files, the following script is
used as the basis of conversion.
http://userweb.kernel.org/~tj/misc/slabh-sweep.py
The script does the followings.
* Scan files for gfp and slab usages and update includes such that
only the necessary includes are there. ie. if only gfp is used,
gfp.h, if slab is used, slab.h.
* When the script inserts a new include, it looks at the include
blocks and try to put the new include such that its order conforms
to its surrounding. It's put in the include block which contains
core kernel includes, in the same order that the rest are ordered -
alphabetical, Christmas tree, rev-Xmas-tree or at the end if there
doesn't seem to be any matching order.
* If the script can't find a place to put a new include (mostly
because the file doesn't have fitting include block), it prints out
an error message indicating which .h file needs to be added to the
file.
The conversion was done in the following steps.
1. The initial automatic conversion of all .c files updated slightly
over 4000 files, deleting around 700 includes and adding ~480 gfp.h
and ~3000 slab.h inclusions. The script emitted errors for ~400
files.
2. Each error was manually checked. Some didn't need the inclusion,
some needed manual addition while adding it to implementation .h or
embedding .c file was more appropriate for others. This step added
inclusions to around 150 files.
3. The script was run again and the output was compared to the edits
from #2 to make sure no file was left behind.
4. Several build tests were done and a couple of problems were fixed.
e.g. lib/decompress_*.c used malloc/free() wrappers around slab
APIs requiring slab.h to be added manually.
5. The script was run on all .h files but without automatically
editing them as sprinkling gfp.h and slab.h inclusions around .h
files could easily lead to inclusion dependency hell. Most gfp.h
inclusion directives were ignored as stuff from gfp.h was usually
wildly available and often used in preprocessor macros. Each
slab.h inclusion directive was examined and added manually as
necessary.
6. percpu.h was updated not to include slab.h.
7. Build test were done on the following configurations and failures
were fixed. CONFIG_GCOV_KERNEL was turned off for all tests (as my
distributed build env didn't work with gcov compiles) and a few
more options had to be turned off depending on archs to make things
build (like ipr on powerpc/64 which failed due to missing writeq).
* x86 and x86_64 UP and SMP allmodconfig and a custom test config.
* powerpc and powerpc64 SMP allmodconfig
* sparc and sparc64 SMP allmodconfig
* ia64 SMP allmodconfig
* s390 SMP allmodconfig
* alpha SMP allmodconfig
* um on x86_64 SMP allmodconfig
8. percpu.h modifications were reverted so that it could be applied as
a separate patch and serve as bisection point.
Given the fact that I had only a couple of failures from tests on step
6, I'm fairly confident about the coverage of this conversion patch.
If there is a breakage, it's likely to be something in one of the arch
headers which should be easily discoverable easily on most builds of
the specific arch.
Signed-off-by: Tejun Heo <tj@kernel.org>
Guess-its-ok-by: Christoph Lameter <cl@linux-foundation.org>
Cc: Ingo Molnar <mingo@redhat.com>
Cc: Lee Schermerhorn <Lee.Schermerhorn@hp.com>
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Before using block_isbad() check if mtd->block_isbad() is defined.
Calculating pgcnt must be done using pgsize defined to 512 on
NOR and mtd->writesize for NAND, not using mtd->writesize directly.
Signed-off-by: Morten Thunberg Svendsen <mts.doredevelopment@gmail.com>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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The mtd_pagetest test did not initialize the pgsize variable, which
basically means it did not work. This problem was reported by
Török Edwin <edwintorok@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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This module tests NAND ECC functions.
The test is simple.
1. Create a 256 or 512 bytes block of data filled with random bytes (data)
2. Duplicate the data block and inject single bit error (error_data)
3. Try to correct error_data
4. Compare data and error_data
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Acked-by: Vimal Singh <vimalsingh@ti.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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- Remove unnecessary memset for bbt
All entries will be initialized at a few lines below
- Remove unnecessary initialization for mtd->erasesize
- Use write_whole_device()
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Check whether index is within bounds before testing the element.
Signed-off-by: Roel Kluin <roel.kluin@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Fix this sparse warnings:
drivers/mtd/tests/mtd_oobtest.c:139:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:192:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:219:41: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:284:25: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:525:25: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:545:25: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:569:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:589:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:613:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:633:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:673:41: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_oobtest.c:701:33: warning: Using plain integer as NULL pointer
drivers/mtd/tests/mtd_readtest.c:74:41: warning: Using plain integer as NULL pointer
Signed-off-by: Hannes Eder <hannes@hanneseder.net>
Acked-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
Signed-off-by: Jiri Kosina <jkosina@suse.cz>
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Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
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Add MTD tests to Kconfig and Makefiles.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test is designed to work for very long time and it tries to
wear few eraseblocks.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This tests makes sure sub-pages on NAND MTD device work fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test just performs random operations on random eraseblocks.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test examines I/O speed of the flash device.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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A simple tests which reads whole MTD device one page at a time.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test checks that NAND pages read/write work fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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This test checks that OOB of a NAND MTD device works fine.
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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