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-rw-r--r--drivers/staging/iio/Documentation/sysfs-bus-iio19
1 files changed, 19 insertions, 0 deletions
diff --git a/drivers/staging/iio/Documentation/sysfs-bus-iio b/drivers/staging/iio/Documentation/sysfs-bus-iio
index f7bc59a57a7c..fb6c3812016e 100644
--- a/drivers/staging/iio/Documentation/sysfs-bus-iio
+++ b/drivers/staging/iio/Documentation/sysfs-bus-iio
@@ -92,6 +92,24 @@ Description:
is required is a consistent labeling. Units after application
of scale and offset are microvolts.
+What: /sys/bus/iio/devices/iio:deviceX/in_capacitanceY_raw
+KernelVersion: 3.2
+Contact: linux-iio@vger.kernel.org
+Description:
+ Raw capacitance measurement from channel Y. Units after
+ application of scale and offset are nanofarads.
+
+What: /sys/.../iio:deviceX/in_capacitanceY-in_capacitanceZ_raw
+KernelVersion: 3.2
+Contact: linux-iio@vger.kernel.org
+Description:
+ Raw differential capacitance measurement equivalent to
+ channel Y - channel Z where these channel numbers apply to the
+ physically equivalent inputs when non differential readings are
+ separately available. In differential only parts, then all that
+ is required is a consistent labeling. Units after application
+ of scale and offset are nanofarads..
+
What: /sys/bus/iio/devices/iio:deviceX/in_temp_raw
What: /sys/bus/iio/devices/iio:deviceX/in_tempX_raw
What: /sys/bus/iio/devices/iio:deviceX/in_temp_x_raw
@@ -251,6 +269,7 @@ What: /sys/bus/iio/devices/iio:deviceX/in_accel_scale_available
What: /sys/.../iio:deviceX/in_voltageX_scale_available
What: /sys/.../iio:deviceX/in_voltage-voltage_scale_available
What: /sys/.../iio:deviceX/out_voltageX_scale_available
+What: /sys/.../iio:deviceX/in_capacitance_scale_available
KernelVersion: 2.635
Contact: linux-iio@vger.kernel.org
Description: